Aligner evaluation system, aligner evaluation method, a...

Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing

Reexamination Certificate

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Details

C700S110000, C700S121000, C703S014000, C702S082000

Reexamination Certificate

active

10636625

ABSTRACT:
An aligner evaluation system includes (a) an error calculation module configured to calculate error information on mutual optical system errors among a plurality of aligners; (b) a simulation module configured to simulate device patterns to be delineated by each of the aligners based on the error information; and (c) a evaluation module configured to evaluate whether each of the aligners has appropriate performances for implementing an organization of a product development machine group based on the simulated device pattern.

REFERENCES:
patent: 5675495 (1997-10-01), Biermann et al.
patent: 5801954 (1998-09-01), Le et al.
patent: 5879844 (1999-03-01), Yamamoto et al.
patent: 6011611 (2000-01-01), Nomura et al.
patent: 6014456 (2000-01-01), Tsudaka
patent: 6404483 (2002-06-01), Segers et al.
patent: 6437858 (2002-08-01), Kouno et al.
patent: 6697698 (2004-02-01), Yoshitake et al.
patent: 6787789 (2004-09-01), Van Der Laan
patent: 6883158 (2005-04-01), Sandstrom et al.
patent: 2002/0013930 (2002-01-01), Inanami et al.
patent: 2002/0046140 (2002-04-01), Kano et al.
patent: 2003/0016341 (2003-01-01), Komine et al.
patent: 1 217 448 (2002-06-01), None
patent: 6-5488 (1994-01-01), None
patent: 7-134393 (1995-05-01), None
patent: 8-334888 (1996-12-01), None
patent: 9-034095 (1997-02-01), None
patent: 10-303124 (1998-11-01), None
patent: 11-102062 (1999-04-01), None
patent: 2001-085317 (2001-03-01), None
patent: 2002-132986 (2002-05-01), None
patent: 2002-184667 (2002-06-01), None
U.S. Appl. No. 10/374,094, filed Feb. 27, 2003, to Nojima et al.
Notification of the Reasons for Refusal on the first examination, issued by the Chinese Patent Office in counterpart Chinese Application No. 03153202.0 and English language translation of a remarks portion of that Notification.
Notice of Grounds for Rejection issued by the Taiwanese Patent Office, dated Feb. 20, 2006, for Taiwanese Patent Application No. 092121376, and English-language translation thereof.
Notice of Grounds for Rejection issued by the Japanese Patent Office, mailed Mar. 7, 2006, for Japanese Patent Application No. P2002-234053, and English-language translation thereof.
Notice of Grounds for Rejection issued by the Japanese Patent Office on Jun. 6, 2006, for Japanese Application No. 2002-234053, and English-language translation thereof.
Search Report issued by the Netherlands Patent Office, on Apr. 7, 2006, for Netherlands Application No. 135224.
Van Den Brink et al., “Matching Management of Multiple Wafer Steppers Using a Stable Standard and a Matching Simulator,” SPIE (1989), 1087:218-232.

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