Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-07-31
2007-07-31
Do, Thuan V. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C702S079000
Reexamination Certificate
active
11066587
ABSTRACT:
In one embodiment, each of a plurality of stimulus signals is sequentially driven onto a number of stimulus signal paths. Each of the plurality of stimulus signals has a trigger edge. As each stimulus signal is driven onto the number of stimulus signal paths, a victim signal having a sensor edge is driven onto a victim signal path. After driving a corresponding stimulus and victim signal, the victim signal is sampled at or about a timing of the signal's sensor edge to thereby characterize the signal's sensor edge. The sensor edge characterizations corresponding to the different stimulus signals are then analyzed to quantify a timing error induced by crosstalk between the victim signal path and one or more of the stimulus signal paths.
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Dimyan Magid Y.
Do Thuan V.
Verigy (Singapore Pte. Ltd.
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