Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – On insulating substrate or layer
Reexamination Certificate
2007-03-27
2007-03-27
Trinh, Michael (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
On insulating substrate or layer
C438S163000, C438S164000, C257SE51005
Reexamination Certificate
active
10677257
ABSTRACT:
A thin film transistor has a structure capable of decreasing deterioration in Vgs-Ids characteristics. The thin film transistor has a source region composed of an N-type impurity-diffused region, a drain region, and a gate electrode, and a channel region formed directly below the gate electrode. To the source region and the drain region are connected a source electrode and a drain electrode, respectively, through a plurality of contact holes. In the channel region are formed a plurality of P-type impurity-diffused regions at constant intervals.
REFERENCES:
patent: 4232327 (1980-11-01), Hsu
patent: 4463492 (1984-08-01), Maeguchi
patent: 4514253 (1985-04-01), Minezaki
patent: 5016986 (1991-05-01), Kawashima et al.
patent: 5266825 (1993-11-01), Tsukada et al.
patent: 5294824 (1994-03-01), Okada
patent: 5477065 (1995-12-01), Nakagawa et al.
patent: 5514879 (1996-05-01), Yamazaki
patent: 5569935 (1996-10-01), Takemura et al.
patent: 5605855 (1997-02-01), Chang et al.
patent: 5616935 (1997-04-01), Koyama et al.
patent: 5714782 (1998-02-01), Nakagawa et al.
patent: 5739574 (1998-04-01), Nakamura
patent: 5830787 (1998-11-01), Kim
patent: 5847422 (1998-12-01), Chi et al.
patent: A 2-15669 (1990-01-01), None
patent: A 2-74076 (1990-03-01), None
patent: A 2-214165 (1990-08-01), None
patent: A 4-75387 (1992-03-01), None
patent: A 4-363028 (1992-12-01), None
patent: A 6-85258 (1994-03-01), None
patent: A 6-123896 (1994-05-01), None
patent: A 7-94744 (1995-04-01), None
patent: A 7-115205 (1995-05-01), None
patent: A 7-147411 (1995-06-01), None
patent: A 8-330596 (1996-12-01), None
patent: A 9-74204 (1997-03-01), None
Oliff & Berridg,e PLC
Seiko Epson Corporation
Trinh Michael
LandOfFree
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