Method for customizing an integrated circuit element

Details Method for customizing an integrated circuit element Method for customizing an integrated circuit element

2007-03-13

2007-03-13

Ahmed, Samir (Department: 2624)

Image analysis

Applications

Manufacturing or product inspection

C348S126000, C714S724000

Reexamination Certificate

active

10312632

ABSTRACT:
A customizing method includes steps which consist in: a) determining on the basis of a circuit model, a set of vectors each corresponding to a theoretical operating time of the circuit when a predetermined sequence of tests is applied, the coefficients of each vector representing the state of a common set of elements of the circuit among which the element to be customized (12); b) defining on the basis of a comparison of vectors, a composite of logic operators applied on the vectors and enabling to extract the coefficient corresponding to the element to be customized (30); c) producing images of the operating circuit at times corresponding to the vectors whereon is applied the composite of logic operators (32); and d) graphically combining the images produced in accordance with a composite of graphic operators corresponding to the composite of logic operators (36).

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J D Russell et al., “E-Beam Testing Using Multiple Adjacent Image Processing for Prototype Validation”, Microelectronic Engineering, NL, Elsevier Publishers BV., Amsterdam vol. 16, No. 1/04, Mar. 1, 1992, pp. 413-420, XP000245368 ISSN: 0167-9317 le document en entier.
K. Nikawa et al., “VLSI Fault Localization Using Electron Beam Voltage Contrast Image.O-Novel Image Acquisition and Localization Method.” Japanese Journal of Applied Physics, JP, Publication Office Japanese Journal of Applied Physics. Tokyo, vol. 31, No. 12B, Part 01, Dec. 1, 1992, pp. 4525-4530. XP000415470, ISSN: 0021-4922 le document en entier.

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