Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-03-13
2007-03-13
Lee, Calvin (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S266000
Reexamination Certificate
active
10974331
ABSTRACT:
A non-volatile memory device and a fabrication method thereof, wherein a charge trapping layer, which is a memory unit, is formed at opposite ends of a gate of a cell, i.e., adjacent to source and drain junction regions, such that portions of the charge trapping layer adjacent to the source and drain junction regions are formed to be thicker than other portions of the charge trapping layer. Therefore, regions adjacent to junction regions function as electron storage regions and hole filing regions.
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patent: 5492846 (1996-02-01), Hara
patent: 5612237 (1997-03-01), Ahn
patent: 5768192 (1998-06-01), Eitan
patent: 6335554 (2002-01-01), Yoshikawa
patent: 2001-156188 (2001-06-01), None
patent: 2001-230332 (2001-08-01), None
F. Chau & Associates LLC
Lee Calvin
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