Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2007-01-30
2007-01-30
Dinh, Son T. (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185050, C365S210130
Reexamination Certificate
active
11213927
ABSTRACT:
Characteristic fluctuation of a reference cell due to read disturb is prevented. A memory cell27mand a reference cell27rrespectively have memory function bodies that are formed on both sides of a gate electrode and have a function to retain electric charge or polarization. The memory cell27mcan store independent information pieces in memory function bodies27mrand27mllocated on both sides of the gate electrode and the independent information pieces are read therefrom. On the other hand, in the reference cell27r, only the information piece stored in a memory function body27rllocated on one side of the gate electrode is referred to in a sense amplifier22.
REFERENCES:
patent: 5616510 (1997-04-01), Wong
patent: 5768184 (1998-06-01), Hayashi et al.
patent: 5776787 (1998-07-01), Keshtbod
patent: 2004/0160828 (2004-08-01), Iwata et al.
patent: 2004/0164359 (2004-08-01), Iwata et al.
patent: 6-60676 (1994-03-01), None
patent: 6-176583 (1994-06-01), None
patent: 2004-221546 (2004-08-01), None
Iwata Hiroshi
Shibata Akihide
Yaoi Yoshifumi
Dinh Son T.
Sharp Kabushiki Kaisha
LandOfFree
Semiconductor storage device and electronic equipment does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor storage device and electronic equipment, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor storage device and electronic equipment will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3759195