Method of forming a conductive structure

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S210000, C438S238000, C438S239000, C438S240000, C438S243000, C438S244000, C438S253000, C438S386000, C438S387000, C438S396000, C438S625000, C438S628000, C438S629000, C438S633000, C438S637000, C438S639000, C438S642000, C438S644000, C438S645000, C438S650000, C438S652000, C438S654000, C438S657000, C438S660000, C438S666000, C438S669000, C438S672000, C438S686000, C438S688000, C438S700000, C257SE21575, C257SE21577

Reexamination Certificate

active

10848321

ABSTRACT:
A method of forming a conductive structure is disclosed. The method includes forming an interconnect in a substrate, and forming a layer of iridium on the interconnect. The layer of iridium has a thickness of less than six hundred angstroms. The method further includes annealing the layer of iridium, forming a dielectric layer on the layer of iridium, and forming a conductive layer on the dielectric layer.

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