Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-05-15
2007-05-15
Pham, Hoai (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S317000
Reexamination Certificate
active
10962818
ABSTRACT:
A semiconductor device and a fabricating method thereof are disclosed. The semiconductor device includes polysilicon gate electrodes, a gate oxide layer, sidewall floating gates, a block oxide layer, source/drain areas, and sidewall spacers. In addition, the method includes the steps of: forming a block dielectric layer and a sacrificial layer on a semiconductor substrate; forming trenches by etching the sacrificial layer; forming sidewall floating gates on lateral faces of the trenches; forming a block oxide layer on the sidewall floating gates; forming polysilicon gate electrodes by a patterning process; removing the sacrificial layer; forming source/drain areas by implanting impurity ions into the resulting structure; injecting carriers or electric charges into the sidewall floating gates; and forming spacers on lateral faces of the polysilicon gate electrodes and the sidewall floating gates.
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Dongbu Electronics Co. Ltd.
Fortney Andrew D.
Pham Hoai
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