Semiconductor memory device, semiconductor device, and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S325000, C257S326000, C257S316000, C257S411000, C257SE29309, C257SE27011

Reexamination Certificate

active

10826612

ABSTRACT:
A semiconductor memory device includes a nonvolatile memory section; and a volatile memory section, wherein the nonvolatile memory section includes a nonvolatile memory cell having a gate electrode formed on a semiconductor layer via a gate insulating film, a channel region disposed under the gate electrode, diffusion regions disposed on both sides of the channel region and having a conductive type opposite to that of the channel region, and memory functional units formed on both sides of the gate electrode and having a function for retaining charges.

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patent: 6642586 (2003-11-01), Takahashi
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patent: 2003/0067032 (2003-04-01), Caprara et al.
patent: 2004/0036068 (2004-02-01), Li
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patent: 2001-156188 (2001-06-01), None
patent: 2001-230332 (2001-08-01), None
patent: 2001-512290 (2001-08-01), None

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