Optics: measuring and testing – By light interference – Having partially reflecting plates in series
Reexamination Certificate
2007-01-16
2007-01-16
Font, Frank G. (Department: 2883)
Optics: measuring and testing
By light interference
Having partially reflecting plates in series
C385S012000, C385S014000, C385S134000, C385S147000, C356S035500, C356S496000, C356S503000, C356S630000, C356S632000, C356S634000
Reexamination Certificate
active
10927057
ABSTRACT:
A coefficient of linear expansion measuring apparatus includes: two reflection plates between which a sample is put, a container to house them, which is filled with a gas having known rate of a refractive index variation, a temperature regulating member to set a temperature in the container variably, a light source to irradiate an irradiating light to reflecting surfaces of the reflection plates, a light receiving element to receive reflected lights in which the lights interferes each other and detecting a light intensity thereof, and a calculating member to calculate a coefficient of linear expansion of the sample, wherein: the calculating member calculates an optical path length variation between the reflecting surfaces from an output variation of the light receiving element, and calculates a length variation of the sample by correcting a part of the optical path length variation derived from the refractive index variation of the gas caused by the temperature variation.
REFERENCES:
patent: 3619463 (1971-11-01), Budin et al.
patent: 3930730 (1976-01-01), Laurens et al.
patent: 5920392 (1999-07-01), Tsai et al.
patent: 6466308 (2002-10-01), Jaing et al.
patent: 2003/0103550 (2003-06-01), Davis et al.
patent: 0 417 934 (1991-03-01), None
patent: 06201620 (1994-07-01), None
patent: A 06-201620 (1994-07-01), None
patent: 11183413 (1999-07-01), None
patent: A 11-183413 (1999-07-01), None
ASTM (American Society for Test and Materials); Designation: E289-99; “Standard Test Method for Linear Thermal Expansion of Rigid Solids with Interferometry”; pp. 1-9.
Daimon Masahiko
Kawasaki Nobuo
Nakajima Toshihide
Okajima Osamu
Blevins Jerry Martin
Font Frank G.
Kabushiki Kaisha Ohara
Oliff & Berridg,e PLC
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