4. Optics: measuring and testing
  5. By light interference
  6. Having partially reflecting plates in series

Toshihide Nakajima

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Coefficient of linear expansion measuring apparatus and...

Optics: measuring and testing – By light interference – Having partially reflecting plates in series
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Substrate and a method for polishing a substrate

Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
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Profile ID: LFUS-PAI-P-3036912

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