Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2007-09-11
2007-09-11
Toledo, Fernando L. (Department: 2823)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S108000, C438S639000, C438S672000, C257S774000, C257S779000
Reexamination Certificate
active
10988613
ABSTRACT:
A method of fabricating a semiconductor device includes forming a lower wiring layer on a semiconductor substrate, forming an interlayer insulating film on the lower wiring layer, layer, forming a plurality of. contact plugs in the interlayer insulating film so that the contact plugs are brought into electrical contact with the lower wiring layer, thereby forming an interlayer wiring layer, forming an upper wiring, layer on the interlayer wiring layer so that the upper wiring layer is brought into electrical contact with the contact plugs, and patterning the upper wiring layer so that the upper wiring layer corresponds to the contact plugs. In the patterning, after the upper wiring layer has been etched, the exposed interlayer insulating film and the exposed contact plugs are etched.
REFERENCES:
patent: 6191027 (2001-02-01), Omura
patent: 6271596 (2001-08-01), Alers
patent: 6291891 (2001-09-01), Higashi et al.
patent: 6448649 (2002-09-01), Lee et al.
patent: 2001/0038147 (2001-11-01), Higashi et al.
patent: 2004/0009653 (2004-01-01), Ueda et al.
patent: 2004/0166668 (2004-08-01), Ito
patent: 2004/0188842 (2004-09-01), Takewaka et al.
patent: 2005/0287803 (2005-12-01), Lee
patent: 2000-208615 (2000-07-01), None
patent: 2002-176098 (2002-06-01), None
Hasegawa Makoto
Ishida Katsuhiro
Ito Katsuya
Sugiura Hiroshi
Kabushiki Kaisha Toshiba
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Toledo Fernando L.
LandOfFree
Method of fabricating semiconductor device having multilayer... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of fabricating semiconductor device having multilayer..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of fabricating semiconductor device having multilayer... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3747114