Semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S473000, C257S383000

Reexamination Certificate

active

11011140

ABSTRACT:
A semiconductor device includes a semiconductor substrate, a T-shaped gate electrode, a moisture-proof insulating film, and an interlayer dielectric film. The T-shaped gate electrode has a leg portion joined to the semiconductor substrate and an overhanging head portion spaced from the semiconductor substrate. The T-shaped gate electrode includes a gate metal containing a material reactive with water. The moisture-proof insulating film is located only in the vicinity of the leg portion and covers a side surface of the leg portion of the T-shaped gate electrode. The interlayer dielectric film is located between the overhanging head portion of the T-shaped gate electrode and the semiconductor substrate and has a dielectric constant that is lower than that of the moisture-proof insulating film.

REFERENCES:
patent: 5923072 (1999-07-01), Wada et al.
patent: 6870232 (2005-03-01), Chan et al.
patent: 2002/0180005 (2002-12-01), Haematsu
patent: 5-166803 (1993-07-01), None
patent: 5-159560 (1993-08-01), None
patent: 5-218016 (1993-08-01), None
patent: 5-234990 (1993-09-01), None
patent: 5-299638 (1993-11-01), None
patent: 7-321127 (1995-12-01), None
patent: 7-326632 (1995-12-01), None
patent: 11-87345 (1999-03-01), None

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