Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2007-03-20
2007-03-20
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C216S058000, C216S079000, C438S707000, C438S710000, C438S719000
Reexamination Certificate
active
10975947
ABSTRACT:
Processes for treating a morphologically-modified surface of a silicon upper electrode of a plasma processing chamber include exposing the surface to a gas composition containing at least one gas-phase halogen fluoride. The gas composition is effective to remove silicon from the morphologically-modified surface and restore the surface state.
REFERENCES:
patent: 4426246 (1984-01-01), Kravitz et al.
patent: 4498953 (1985-02-01), Cook et al.
patent: 4595484 (1986-06-01), Giammarco et al.
patent: 5565038 (1996-10-01), Ashley
patent: 5665203 (1997-09-01), Lee et al.
patent: 5888906 (1999-03-01), Sandhu et al.
patent: 6090718 (2000-07-01), Soga et al.
patent: 6124211 (2000-09-01), Butterbaugh et al.
patent: 6162367 (2000-12-01), Tai et al.
patent: 6290779 (2001-09-01), Saleh et al.
patent: 6391788 (2002-05-01), Khan et al.
patent: 6489249 (2002-12-01), Mathad et al.
patent: 6500356 (2002-12-01), Goto et al.
patent: 6503842 (2003-01-01), Sandhu et al.
patent: 6635185 (2003-10-01), Demmin et al.
patent: 6730600 (2004-05-01), Layadi et al.
patent: 2003/0150476 (2003-08-01), Suzuki
patent: 2003/0190814 (2003-10-01), Kumar et al.
Ibbotson, D.E., et al. “Plasmaless dry etching of silicon with fluorine-containing compounds,” J. Appl Phys 56 (10), Nov. 15, 1984, pp. 2939-2942.
Ibbotson, D.E., et al. “Selective interhalogen etching of tantalum compounds and other semiconductor materials,” Appl. Phys. Lett. 46 (8), Apr. 15, 1985, pp. 794-796.
Yaws, Carl L.,The Matheson Gas Data Book, 7thedition, McGraw-Hill (2001).
Au Bac H.
Buchanan & Ingersoll & Rooney PC
Lam Research Corporation
Smith Zandra V.
LandOfFree
Processes for treating morphologically-modified silicon... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Processes for treating morphologically-modified silicon..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Processes for treating morphologically-modified silicon... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3732747