Solid-state imaging device and camera

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S292000, C257S510000

Reexamination Certificate

active

10930814

ABSTRACT:
A solid-state imaging device is formed on a silicon substrate for providing a MOS type solid-state imaging device which has a device isolation structure and causes a small amount of leak current. The solid-state imaging device includes, for each pixel, an imaging region which includes a photodiode having a charge accumulation region of a first conductivity type, a transistor and a device isolation region whose depth is less than a depth of the charge accumulation region of the first conductivity type, at which an impurity density is at maximum.

REFERENCES:
patent: 5668390 (1997-09-01), Morimoto
patent: 6239839 (2001-05-01), Matsunaga et al.
patent: 2002/0001039 (2002-01-01), Ishiwata
patent: 2002/0105585 (2002-08-01), Kimura
patent: 2004/0094784 (2004-05-01), Rhodes et al.
patent: 2004/0173824 (2004-09-01), Nagasaki et al.
patent: 2006/0076582 (2006-04-01), Nagasaki et al.
patent: 1 455 389 (2004-09-01), None
patent: 10-308507 (1998-11-01), None
patent: 2000-196057 (2000-07-01), None

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