Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-04-03
2007-04-03
Quach, T. N. (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S292000, C257S510000
Reexamination Certificate
active
10930814
ABSTRACT:
A solid-state imaging device is formed on a silicon substrate for providing a MOS type solid-state imaging device which has a device isolation structure and causes a small amount of leak current. The solid-state imaging device includes, for each pixel, an imaging region which includes a photodiode having a charge accumulation region of a first conductivity type, a transistor and a device isolation region whose depth is less than a depth of the charge accumulation region of the first conductivity type, at which an impurity density is at maximum.
REFERENCES:
patent: 5668390 (1997-09-01), Morimoto
patent: 6239839 (2001-05-01), Matsunaga et al.
patent: 2002/0001039 (2002-01-01), Ishiwata
patent: 2002/0105585 (2002-08-01), Kimura
patent: 2004/0094784 (2004-05-01), Rhodes et al.
patent: 2004/0173824 (2004-09-01), Nagasaki et al.
patent: 2006/0076582 (2006-04-01), Nagasaki et al.
patent: 1 455 389 (2004-09-01), None
patent: 10-308507 (1998-11-01), None
patent: 2000-196057 (2000-07-01), None
Mori Mitsuyoshi
Yamaguchi Takumi
Yoshida Shinji
Quach T. N.
Wenderoth , Lind & Ponack, L.L.P.
LandOfFree
Solid-state imaging device and camera does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Solid-state imaging device and camera, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Solid-state imaging device and camera will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3726760