Semiconductor device manufacturing: process – Forming bipolar transistor by formation or alteration of... – Having heterojunction
Reexamination Certificate
2006-12-05
2006-12-05
Dang, Trung (Department: 2823)
Semiconductor device manufacturing: process
Forming bipolar transistor by formation or alteration of...
Having heterojunction
C438S373000, C257S197000, C257SE29188
Reexamination Certificate
active
07144787
ABSTRACT:
Methods of boosting the performance of bipolar transistor, especially SiGe heterojunction bipolar transistors, is provided together with the structure that is formed by the inventive methods. The methods include providing a species-rich dopant region comprising C, a noble gas, or mixtures thereof into at least a collector. The species-rich dopant region forms a perimeter or donut-shaped dopant region around a center portion of the collector. A first conductivity type dopant is then implanted into the center portion of the collector to form a first conductivity type dopant region that is laterally constrained, i.e., confined, by the outer species-rich dopant region.
REFERENCES:
patent: 6265275 (2001-07-01), Marty et al.
patent: 6534371 (2003-03-01), Coolbaugh et al.
patent: 6563146 (2003-05-01), Yuki et al.
patent: 2002/0177253 (2002-11-01), Johnson et al.
patent: 2003/0173580 (2003-09-01), Coolbaugh et al.
patent: 2005/0023642 (2005-02-01), Heinemann et al.
Dokumaci Omer H.
Freeman Gregory G.
Khater Marwan H.
Krishnasamy Rajendran
Schonenberg Kathryn T.
Dang Trung
Sabo, Esq. William D.
Scully , Scott, Murphy & Presser, P.C.
LandOfFree
Methods to improve the SiGe heterojunction bipolar device... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Methods to improve the SiGe heterojunction bipolar device..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Methods to improve the SiGe heterojunction bipolar device... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3716045