Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material
Reexamination Certificate
2006-10-10
2006-10-10
Nadav, Ori (Department: 2811)
Semiconductor device manufacturing: process
Coating with electrically or thermally conductive material
To form ohmic contact to semiconductive material
C438S675000, C438S700000, C257S774000
Reexamination Certificate
active
07119010
ABSTRACT:
An integrated circuit and manufacturing method therefor is provided having a base with a first dielectric layer formed thereon. A second dielectric layer is formed over the first dielectric layer. A third dielectric layer is formed in spaced-apart strips over the second dielectric layer. A first trench opening is formed through the first and second dielectric layers between the spaced-apart strips of the third dielectric layer. A second trench opening is formed contiguously with the first trench opening through the first dielectric layer between the spaced-apart strips of the third dielectric layer. Conductor metals in the trench openings form self-aligned trench interconnects.
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Cha Randall Cher Liang
Goh Wang Ling
Lim Yeow Kheng
See Alex
Chartered Semiconductor Manfacturing Ltd.
Ishimaru Mikio
Nadav Ori
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