Positive resist composition and method of forming a resist...

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Radiation sensitive composition or product or process of making

Reexamination Certificate

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C430S907000, C430S906000, C430S910000, C430S914000, C430S326000

Reexamination Certificate

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07118846

ABSTRACT:
A positive resist composition comprises (A) a resin comprising specific repeating units and coming to have enhanced solubility in an alkaline developing solution by the action of an acid and (B) a compound generating an acid by the action of actinic rays or a radiation.

REFERENCES:
patent: 6013411 (2000-01-01), Aoai et al.
patent: 6939662 (2005-09-01), Mizutani et al.
patent: 2001/0041300 (2001-11-01), Kodama et al.
patent: 2002/0155376 (2002-10-01), Hashimoto et al.
patent: 1 341 038 (2003-09-01), None
patent: 1 367 440 (2003-12-01), None
patent: 2002-322217 (2002-11-01), None
patent: WO 00/17712 (2000-03-01), None
patent: WO 00/67072 (2000-11-01), None
Shintaro Yamada et al., “Design and Study of Resist Materials for 157nm Lithography”, Advances in Resist Technology and Processing XX. Theodore H. Fedynyshyn, Proceedings of SPIE vol. 5039 (2003), pp. 569-579.
Partial European Search Report dated Sep. 2, 2004.
European Search Report dated May 6, 2005.

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