Program counter trace stack, access port, and serial scan path

Details Program counter trace stack, access port, and serial scan path Program counter trace stack, access port, and serial scan path

2006-02-07

2006-02-07

Baker, Stephen M. (Department: 2133)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

Reexamination Certificate

active

06996747

ABSTRACT:
A data processing device including a semiconductor chip, an electronic processor on-chip and an on-chip condition sensor connected to the electronic processor for analysis of the operations.

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Breuer et al., “A Test and Maintenance Controller for a Module Containing Testable Chips”, Proceedings 1988 Internation Test Conference, Sep. 1988, pp. 502-513.

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