Method of forming a non-volatile electron storage memory and...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S410000, C257S412000, C438S211000, C438S257000, C438S593000, C438S686000, C977S726000

Reexamination Certificate

active

07005697

ABSTRACT:
The invention provides a method of forming an electron memory storage device and the resulting device. The device comprises a gate structure which, in form, comprises a first gate insulating layer formed over a semiconductor substrate, a self-forming electron trapping layer of noble metal nano-crystals formed over the first gate insulating layer, a second gate insulating layer formed over the electron trapping layer, a gate electrode formed over the second gate insulating layer, and source and drain regions formed on opposite sides of the gate structure.

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patent: 6753568 (2004-06-01), Nakazato et al.

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