Active solid-state devices (e.g. – transistors – solid-state diode – Lead frame – On insulating carrier other than a printed circuit board
Reexamination Certificate
2006-10-03
2006-10-03
Clark, S. V. (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Lead frame
On insulating carrier other than a printed circuit board
C257S669000
Reexamination Certificate
active
07115975
ABSTRACT:
When bonding inner leads of a flexible film wiring board to electrode pads of a semiconductor element substrate, by absorbing a stress generated due to a difference in thermal expansion coefficient between the flexible film wiring board and the semiconductor element substrate during cooling after heat-bonding, by a through-hole or recessed groove portion formed in the inner leads, it is possible to prevent peeling off of a bonding portion and improve the reliability.
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