Method of etching ferroelectric devices

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching

Reexamination Certificate

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C438S717000, C438S720000

Reexamination Certificate

active

07098142

ABSTRACT:
A method of etching a ferroelectric device100having a ferroelectric layer112between a top and a bottom electrode114, 108is disclosed herein. Hardmasks116, 118are deposited on the top electrode114, two or more hardmasks being spaced apart by narrow first regions115and spaced apart from other hardmasks by wider second regions117. The top electrode114and ferroelectric layer112are then etched to pattern the top electrode114thus forming capacitors102, 104, and the bottom electrode108is etched by a process in which the second regions are etched more slowly than the second regions. Those capacitors having a first region between them have a common bottom electrode108, but in the second regions the bottom electrode is severed. To pattern the bottom electrode108, a fluorine-based chemistry followed thereafter by a CO-based chemistry are used in a two step etching process.

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