Method of forming metal line in semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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C438S622000, C438S692000

Reexamination Certificate

active

07148137

ABSTRACT:
A method of forming a metal line in a semiconductor device. The method includes forming an insulating interlayer over a substrate provided with a lower metal line, and forming a hole exposing the lower metal line. The method also includes forming a first metal layer on the insulating interlayer including an inside of the hole and the lower metal line, forming a conductor layer on the first metal layer to fill the hole, and etching back the conductor layer to form a plug until the first metal layer is exposed. The method further includes stacking a second metal layer and a third metal layer on the first metal layer, and patterning the second metal layer, the third metal layer, and the first metal layer to form an upper metal line overlapped with the plug using an etch mask defining the upper metal line.

REFERENCES:
patent: 5874358 (1999-02-01), Myers et al.
patent: 6133142 (2000-10-01), Tran et al.
patent: 6274475 (2001-08-01), Shields
patent: 6274499 (2001-08-01), Gupta et al.
patent: 6350665 (2002-02-01), Jin et al.
patent: 6376325 (2002-04-01), Koo

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