Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-08-15
2006-08-15
Lee, Eugene (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S300000, C257S296000, C257S301000, C257SE27084
Reexamination Certificate
active
07091547
ABSTRACT:
A semiconductor memory cell, in particular, in a DRAM memory cell array, includes a selection transistor and a storage capacitor. The storage capacitor has a first and a second capacitor electrodes. The first capacitor electrode is connected to a read-out line via the selection transistor. A control terminal of the selection transistor is connected to a control line. A layer of a superionic conductor is arranged between the first and second capacitor electrodes of the storage capacitor. The high conductivity of the superionic conductor for ions in association with a negligible electron conductivity allows extremely high capacitances to be produced in a small space.
REFERENCES:
patent: 3375420 (1968-03-01), Sher et al.
patent: 4084101 (1978-04-01), Sher
patent: 4152597 (1979-05-01), Sher
patent: 4213797 (1980-07-01), Sher
patent: 4761385 (1988-08-01), Pfiester
patent: 4855953 (1989-08-01), Tsukamoto et al.
patent: 4864462 (1989-09-01), Madou et al.
patent: 4906590 (1990-03-01), Kanetaki et al.
patent: 4956692 (1990-09-01), Ozaki et al.
patent: 5027172 (1991-06-01), Jeon
patent: 5185284 (1993-02-01), Motonami
patent: 5310696 (1994-05-01), McCann et al.
patent: 5411911 (1995-05-01), Ikeda et al.
patent: 5555520 (1996-09-01), Sudo et al.
patent: 5701022 (1997-12-01), Kellner et al.
patent: 5867420 (1999-02-01), Alsmeier
patent: 5920785 (1999-07-01), Chi et al.
patent: 5959326 (1999-09-01), Aiso et al.
patent: 5981332 (1999-11-01), Mandelman et al.
Gabusjan et al. “Improved Ion-Conducting Layer Replacing the Insulator in a Capacitive Chemical Semiconductor Sensor” 199 p. 263-273, vol. 10, No. 5.
Tigran Gabusjan, Lars Bartholomaus and Werner Moritz,Improved Ion-Conducting Layer Replacing the Insulator in a Capacitive Chemical Semiconductor Sensor, Sensors and Materials, 1998, pp. 263-273, vol. 10, No. 5, Humboldt-University Berlin, Walther-Nernst-Institut of Physical and Theoretical Chemistry, Berlin, Germany.
George Thieme Verlag, Lonenleiter, 1995, 2 pages.
Edell Shapiro & Finnan LLC
Infineon - Technologies AG
Lee Eugene
LandOfFree
Semiconductor storage location does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor storage location, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor storage location will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3671101