Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-02-28
2006-02-28
Smith, Matthew (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C703S016000, C703S002000, C702S111000, C702S124000, C702S191000, C714S032000, C324S527000, C324S537000, C324S613000, C324S615000
Reexamination Certificate
active
07007252
ABSTRACT:
One embodiment of the invention provides a system that characterizes cells within an integrated circuit. During operation, the system obtains a number of input noise signals to be applied to the cell. The system then simulates responses of the cell to each of the input noise signals, and stores a representation of the responses. This allows a subsequent analysis operation to access the stored representation to determine a response of the cell instead of having to perform a time-consuming simulation operation.
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Fallah-Tehrani Peivand
Gyure Alexander
Kasnavi Seyed Alireza
Lo Chi-Chong
Luo Yansheng
Kik Phallaka
Park Vaughan & Fleming LLP
Smith Matthew
Synopsys Inc.
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