Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...
Reexamination Certificate
2006-10-17
2006-10-17
Whitehead, Jr., Carl (Department: 2813)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Assembly of plural semiconductive substrates each possessing...
C438S106000, C257S778000, C257S779000
Reexamination Certificate
active
07122403
ABSTRACT:
A low resistance package-to-die interconnect scheme for reduced die stresses includes a relatively low melting temperature and yield strength solder on the die and a relatively higher melting temperature and electrically conductive material such as copper on the substrate. A soldered joint connects the solder to the electrically conductive material to couple/connect the die and substrate to one another. The soldered joint is formed by heating the die and solder thereon to at least the melting temperature of the solder and thereafter contacting the molten solder with the conductive material on the substrate, which is at a substantially lower temperature for minimizing residual stress from soldering due to coefficient of thermal expansion mismatch between the substrate and die.
REFERENCES:
patent: 3871015 (1975-03-01), Lin et al.
patent: 4481403 (1984-11-01), Del Monte
patent: 5308980 (1994-05-01), Barton
patent: 5369551 (1994-11-01), Gore et al.
patent: 5542601 (1996-08-01), Fallon et al.
patent: 5698465 (1997-12-01), Lynch et al.
patent: 5773889 (1998-06-01), Love et al.
patent: 5790377 (1998-08-01), Schreiber et al.
patent: 5872401 (1999-02-01), Huff et al.
patent: 5889652 (1999-03-01), Turturro
patent: 5931371 (1999-08-01), Pao et al.
patent: 5936304 (1999-08-01), Lii et al.
patent: 6002590 (1999-12-01), Farnworth et al.
patent: 6014317 (2000-01-01), Sylvester
patent: 6049124 (2000-04-01), Raiser et al.
patent: 6162660 (2000-12-01), LaFontaine et al.
patent: 6170155 (2001-01-01), Marion et al.
patent: 6191952 (2001-02-01), Jimarez et al.
patent: 6222277 (2001-04-01), Downes
patent: 6259155 (2001-07-01), Interrante et al.
patent: 6310403 (2001-10-01), Zhang et al.
patent: 6320754 (2001-11-01), Dauksher et al.
patent: 6330967 (2001-12-01), Milewski et al.
patent: 6365435 (2002-04-01), Wang et al.
patent: 6395124 (2002-05-01), Oxman et al.
patent: 6402012 (2002-06-01), Bolduc
patent: 6472762 (2002-10-01), Kutlu
patent: 6555052 (2003-04-01), Soga et al.
patent: 6581821 (2003-06-01), Sarkhel
patent: 6664637 (2003-12-01), Jimarez et al.
patent: 6689635 (2004-02-01), Cobbley et al.
patent: 6798072 (2004-09-01), Kajiwara et al.
patent: 6847118 (2005-01-01), Milewski et al.
patent: 2001/0008309 (2001-07-01), Iijima et al.
patent: 2002/0140094 (2002-10-01), Kubota et al.
patent: 2002/0155637 (2002-10-01), Lee
patent: 2002/0195707 (2002-12-01), Bernier et al.
patent: 2003/0003624 (2003-01-01), Farooq et al.
patent: 2004/0227256 (2004-11-01), Seko
patent: 59-177957 (1984-10-01), None
patent: 08-332590 (1996-12-01), None
patent: 09-275107 (1997-10-01), None
patent: 10-12659 (1998-01-01), None
ANONYMOUS, “Solder ball for semiconductor chip—has height increased so that stress caused by difference in thermal expansion between chip and substrate is minimised”Research Disclosure RD-291011, Derwent 1988-255069,(Jul. 10, 1988),2 pages.
Hong, B. Z., “Thermal Fatigue Analysis of CBGA Package with Lead-Free Solder-Fillets”,Proceedings of the 1998 Intersociety Conference on Thermal Phenomena, (Aug., 1998),205-211.
Karim, Z. S., et al., “Lead-Free Bump Interconnections for Flip-Chip Applications”,Proceedings of the 2000 IEEE/CPMT International Electronics Manufacturing Technology Symposium, (Jan., 2000),274-278.
Wang, T. , et al., “Studies on A Novel Flip-Chip Interconnect Structure-Pillar Bump”,Proceedings of the 2001 Electronic Components and Technology Conference, (Apr., 2001),5 p.
Xia, G. , et al., “The Effect of Cu Stud Structure and Eutectic Solder Electroplating on Intermetallic Growth and Reliability of Flip-Chip Solder Bump”,Proceedings of the 2000 Electronic Components and Technology Conference, (Sep., 2000),54-59.
Chandran Biju
Gonzalez Carlos A.
Intel Corporation
Jr. Carl Whitehead
Mitchell James
Schwegman Lundberg Woessner & Kluth P.A.
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