Method for manufacturing semiconductor apparatus, and...

Semiconductor device manufacturing: process – Bonding of plural semiconductor substrates – Subsequent separation into plural bodies

Reexamination Certificate

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Reexamination Certificate

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07056810

ABSTRACT:
According to the package and the method for manufacturing the package of the present invention, a chip can be formed extremely to be thin, and manufactured at lower cost and higher throughput, and the variations of a chip thickness can be reduced without back grind that causes cracks or polishing marks. In the present invention, a semiconductor film with a thickness of at most 500 μm deposited over a substrate serving as a support medium is crystallized with a CW laser light, and a chip having a semiconductor device is formed to have a total thickness of 5 μm, preferably at most 2 μm by using the crystallized semiconductor film. Consequently, the chip is mounted on an interposer after separating a substrate.

REFERENCES:
patent: 5643801 (1997-07-01), Ishihara et al.
patent: 5897799 (1999-04-01), Yamazaki et al.
patent: 5900980 (1999-05-01), Yamazaki et al.
patent: 5923962 (1999-07-01), Ohtani et al.
patent: 5953597 (1999-09-01), Kusumoto et al.
patent: 5959779 (1999-09-01), Yamazaki et al.
patent: 6002523 (1999-12-01), Tanaka
patent: 6038075 (2000-03-01), Yamazaki et al.
patent: 6242292 (2001-06-01), Yamazaki et al.
patent: 6339010 (2002-01-01), Sameshima
patent: 6372608 (2002-04-01), Shimoda et al.
patent: 6544825 (2003-04-01), Yamazaki
patent: 6548370 (2003-04-01), Kasahara et al.
patent: 2004/0069751 (2004-04-01), Yamazaki et al.
patent: 2004/0119955 (2004-06-01), Tanaka
patent: 2004/0169023 (2004-09-01), Tanaka
patent: 2004/0171237 (2004-09-01), Tanaka et al.
patent: 2004/0253838 (2004-12-01), Yamazaki et al.
patent: 2004/0259387 (2004-12-01), Yamazaki et al.
patent: 2005/0130391 (2005-06-01), Takayama et al.
patent: 2005/0148121 (2005-07-01), Yamazaki et al.
patent: 2005/0202595 (2005-09-01), Yonehara et al.
patent: 04-124813 (1992-04-01), None
patent: 07-183540 (1995-07-01), None
patent: 07-187890 (1995-07-01), None
N. Hayasaka, “Recent Status of Thin Wafer Chip (die) Mounting,” SEMICON Japan 2002, Dec. 5, 2002, pp. 3-8.

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