Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C438S286000, C257SE21417

Reexamination Certificate

active

07122861

ABSTRACT:
The present invention relates to a semiconductor device including a high withstand voltage MOS transistor and a manufacturing method thereof. The semiconductor device according to the present invention includes a MOS transistor in which a second-conductivity type source region is formed on a first-conductivity type semiconductor region, an offset drain region is interconnected to a second-conductivity type drain region and has a concentration lower than an impurity concentration of a drain region, the offset drain region is composed of a portion that does not overlap a first-conductivity type semiconductor region and a portion that overlaps part of the surface of the first-conductivity type semiconductor region and a gate electrode is formed on the surface extending from a channel region between the source region and the offset drain region to part of the offset drain region through a gate insulating film.Thus, there can be obtained an offset drain type MOS transistor having a stable threshold voltage Vth and a low ON-state resistance.

REFERENCES:
patent: 4628341 (1986-12-01), Thomas
patent: 5844275 (1998-12-01), Kitamura et al.
patent: 5917217 (1999-06-01), Kitamura et al.
patent: 5932897 (1999-08-01), Kawaguchi et al.
patent: 6380566 (2002-04-01), Matsudai et al.
patent: 2001/0012671 (2001-08-01), Hoshino
patent: 0179693 (1986-04-01), None
patent: 0849801 (1998-06-01), None
patent: 53-67373 (1978-06-01), None
patent: 61-88553 (1986-05-01), None
patent: 06-21441 (1994-01-01), None
patent: 10-189762 (1998-07-01), None
patent: 2001-94094 (2001-04-01), None

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