Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-10-31
2006-10-31
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C361S688000, C361S796000, C361S831000
Reexamination Certificate
active
07129732
ABSTRACT:
A test apparatus for testing circuitized substrates such as PCB test coupons for thru-hole failure in which the substrate may be cooled to a temperature less than the ambient temperature surrounding the test apparatus housing in which the testing is accomplished. A method of testing substrates is also provided.
REFERENCES:
patent: 3808532 (1974-04-01), Yuska
patent: 4510446 (1985-04-01), Braun et al.
patent: 4724383 (1988-02-01), Hart
patent: 5072177 (1991-12-01), Liken et al.
patent: 5172063 (1992-12-01), Munikoti et al.
patent: 5198756 (1993-03-01), Jenkins et al.
patent: 5325068 (1994-06-01), Rauf
patent: 5392219 (1995-02-01), Birch et al.
patent: 5701667 (1997-12-01), Birch et al.
patent: 6175498 (2001-01-01), Conroy et al.
patent: 6521841 (2003-02-01), Kawaguchi
patent: 6711961 (2004-03-01), Theriault et al.
patent: 6714419 (2004-03-01), Liken et al.
patent: 6984974 (2006-01-01), Liken et al.
patent: 2003/0112025 (2003-06-01), Hamilton et al.
“DC Current Induced Thermal Cycling Test”, by IPC (2215 Sanders road, Northbrook IL 60062-6135) No. 2.6.26, Nov. 1999, Four pages.
“A New Power Cycling Technique For Accelerated Reliability Evaluation of Plated Through Holes and Interconnects in PCB's”, IEEE Transaction On Components, Hybrids, And Manufacturing Technology, vol. 13, No. 4, Dec. 1990, pp. 865-872.
“Thermal Stress—Power Cycling Method”, Author Unknown, Dec. 3, 1992, 6 pages.
“IPC-TM-650 Test Methods Manual”, IPC Associated Connection Electronics Industries, May 2001 (only two pages).
Endicott Interconnect Technologies, Inc.
Fraley Lawrence R.
Hinman, Howard & Kattell LLP
Patel Paresh
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