Substrate test apparatus and method of testing substrates

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C361S688000, C361S796000, C361S831000

Reexamination Certificate

active

07129732

ABSTRACT:
A test apparatus for testing circuitized substrates such as PCB test coupons for thru-hole failure in which the substrate may be cooled to a temperature less than the ambient temperature surrounding the test apparatus housing in which the testing is accomplished. A method of testing substrates is also provided.

REFERENCES:
patent: 3808532 (1974-04-01), Yuska
patent: 4510446 (1985-04-01), Braun et al.
patent: 4724383 (1988-02-01), Hart
patent: 5072177 (1991-12-01), Liken et al.
patent: 5172063 (1992-12-01), Munikoti et al.
patent: 5198756 (1993-03-01), Jenkins et al.
patent: 5325068 (1994-06-01), Rauf
patent: 5392219 (1995-02-01), Birch et al.
patent: 5701667 (1997-12-01), Birch et al.
patent: 6175498 (2001-01-01), Conroy et al.
patent: 6521841 (2003-02-01), Kawaguchi
patent: 6711961 (2004-03-01), Theriault et al.
patent: 6714419 (2004-03-01), Liken et al.
patent: 6984974 (2006-01-01), Liken et al.
patent: 2003/0112025 (2003-06-01), Hamilton et al.
“DC Current Induced Thermal Cycling Test”, by IPC (2215 Sanders road, Northbrook IL 60062-6135) No. 2.6.26, Nov. 1999, Four pages.
“A New Power Cycling Technique For Accelerated Reliability Evaluation of Plated Through Holes and Interconnects in PCB's”, IEEE Transaction On Components, Hybrids, And Manufacturing Technology, vol. 13, No. 4, Dec. 1990, pp. 865-872.
“Thermal Stress—Power Cycling Method”, Author Unknown, Dec. 3, 1992, 6 pages.
“IPC-TM-650 Test Methods Manual”, IPC Associated Connection Electronics Industries, May 2001 (only two pages).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Substrate test apparatus and method of testing substrates does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Substrate test apparatus and method of testing substrates, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Substrate test apparatus and method of testing substrates will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3646824

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.