Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-02-21
2006-02-21
Nhu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S320000
Reexamination Certificate
active
07002200
ABSTRACT:
A split-gate flash memory device. The device includes a floating gate, a control gate, and an erase gate. The floating gate is overlying a substrate. The control gate is laterally adjacent to the floating gate and overlying the substrate. The erase gate is laterally adjacent to the floating gate and overlying the control gate, in which the erase gate is between a sidewall spacer and the floating gate.
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Nhu David
Taiwan Semiconductor Manufacturing Co. Ltd.
Thomas Kayden Horstemeyer & Risley
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