Semiconductor wafer with ID mark, equipment for and method...

Details Semiconductor wafer with ID mark, equipment for and method... Semiconductor wafer with ID mark, equipment for and method...

2006-06-06

2006-06-06

Smith, Zandra V. (Department: 2822)

Active solid-state devices (e.g., transistors, solid-state diode

Physical configuration of semiconductor

C257S622000, C438S974000

Reexamination Certificate

active

07057259

ABSTRACT:
A semiconductor wafer has a bevel contour formed along the periphery thereof, products formed on the wafer, and an ID mark formed on the bevel contour. The ID mark shows at least the properties, manufacturing conditions, and test results of the products.

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ASTM Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal F26-87a.
Notification of the First Office Action issued by the Chinese Patent Office in Chinese Patent Application No. 02124538.X.

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