Method of displaying dynamically scattering vector of X-ray...

Details Method of displaying dynamically scattering vector of X-ray... Method of displaying dynamically scattering vector of X-ray...

2006-10-10

2006-10-10

Bruce, David V. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S080000

Reexamination Certificate

active

07120227

ABSTRACT:
The scattering vector of X-ray diffraction is dynamically displayed on a screen. A dynamic motion and tracks of the tip location of the scattering vector of X-ray diffraction is displayed two-dimensionally or three-dimensionally under changing measuring conditions on a screen which represents the reciprocal space of a sample crystal. The tip location of the scattering vector can be seen dynamically and the X-ray diffraction phenomenon under changing measuring conditions can be readily understood, effecting easy consideration of the measuring conditions and easy evaluation of the measured results.

REFERENCES:
patent: 6198796 (2001-03-01), Yokoyama et al.
patent: 2003/0009316 (2003-01-01), Yokoyama et al.
patent: 0 959 345 (1999-11-01), None
patent: 0 962 762 (1999-12-01), None
patent: 2000-039409 (2000-02-01), None

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