Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-11-21
2006-11-21
Lee, Eugene (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257SE29129
Reexamination Certificate
active
07138679
ABSTRACT:
A semiconductor memory device comprises a silicon substrate having a main surface, a trench formed on the silicon substrate to open in the main surface and a memory cell formed on the trench. The memory cell includes a first storage holding part formed on a first side wall of the trench, a second storage holding part formed on a second side wall of the trench, impurity diffusion layers formed on both sides of the trench and a gate electrode formed to extend from the trench onto the impurity diffusion layers for covering the first and second storage holding parts.
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Lee Eugene
McDermott Will & Emery LLP
Renesas Technology Corp.
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