Method and apparatus for determining the optimal fanout...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000, C716S030000

Reexamination Certificate

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07093217

ABSTRACT:
A method of determining an optimal transistor fanout. The method includes creating a sizing model by replacing at least one logic element in a circuit description with a sizing element that includes a dynamic resistor. The method also includes determining a steady state solution to the sizing model and determining at least one transistor fanout from the steady state solution.

REFERENCES:
patent: 6629301 (2003-09-01), Sutherland et al.
patent: 6725438 (2004-04-01), van Ginneken
patent: 2003/0088842 (2003-05-01), Cirit
patent: 2004/0130349 (2004-07-01), Morgenshtein et al.
Rezvani et al., “LEOPARD: a Logical Effort-based fanout OPtimizer for ARea and Delay”, Nov. 1999, IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, pp. 516-519.
Wei Chen, Cheng Ta Hsieh, Massoud Pedram, “Simultaneous Gate Sizing and Fanout Optimization”, Nov. 2000, Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design.
Ivan E. Sutherland, Jon K. Lexau, “Designing Fast Asynchronous Circuits”, Mar. 2001, Proceedings of the 7th International Symposium on Asynchronous Circuits and Systems.
Sutherland et al., Logical Effort Designing Fast CMOS Circuits, 1999.

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