Method and apparatus for manufacturing test generation

Details Method and apparatus for manufacturing test generation Method and apparatus for manufacturing test generation

2006-10-24

2006-10-24

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

07127691

ABSTRACT:
An improved method and process is provided for verifying a digital logic design complies with certain manufacturing test rules or guidelines. A replacement is created for any portion of a design to make it usable by the manufacturing test tool set, without requiring the contents of that portion of the design to be implemented. The inputs and outputs of a portion of the design are examined for violations of the manufacturing test rules or guidelines. If there are no violations, the contents of this portion of the design are replaced with some basic contents which satisfy the manufacturing structure rules. The interconnections between logic blocks can then be tested using test generation tools to ensure the design does not violate manufacturing test rules or guidelines The compliance verification can thus be done much earlier in the design process than typically occurs.

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