Hardware debugging in a hardware description language

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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C716S030000

Reexamination Certificate

active

07069526

ABSTRACT:
Techniques and systems for analysis, diagnosis and debugging fabricated hardware designs at a Hardware Description Language (HDL) level are described. Although the hardware designs (which were designed in HDL) have been fabricated in integrated circuit products with limited input/output pins, the techniques and systems enable the hardware designs within the integrated circuit products to be comprehensively analyzed, diagnosed, and debugged at the HDL level at speed. The ability to debug hardware designs at the HDL level facilitates correction or adjustment of the HDL description of the hardware designs.

REFERENCES:
patent: 4306286 (1981-12-01), Cocke et al.
patent: 4590581 (1986-05-01), Widdoes, Jr.
patent: 4635218 (1987-01-01), Widdoes, Jr.
patent: 4675646 (1987-06-01), Lauer
patent: 4845712 (1989-07-01), Sanner et al.
patent: 4901259 (1990-02-01), Watkins
patent: 4937770 (1990-06-01), Samuels et al.
patent: 4937827 (1990-06-01), Beck et al.
patent: 5036473 (1991-07-01), Butts et al.
patent: 5146460 (1992-09-01), Ackerman et al.
patent: 5281864 (1994-01-01), Hahn et al.
patent: 5321828 (1994-06-01), Phillips et al.
patent: 5329470 (1994-07-01), Sample et al.
patent: 5329471 (1994-07-01), Swoboda et al.
patent: 5369593 (1994-11-01), Papamarcos et al.
patent: 5412260 (1995-05-01), Tsui et al.
patent: 5416919 (1995-05-01), Ogino et al.
patent: 5425036 (1995-06-01), Liu et al.
patent: 5537580 (1996-07-01), Giomi et al.
patent: 5544311 (1996-08-01), Harenberg et al.
patent: 5546562 (1996-08-01), Patel
patent: 5560009 (1996-09-01), Lenkov et al.
patent: 5568437 (1996-10-01), Jamal
patent: 5572712 (1996-11-01), Jamal
patent: 5574388 (1996-11-01), Barbier et al.
patent: 5581742 (1996-12-01), Lin et al.
patent: 5596587 (1997-01-01), Douglas et al.
patent: 5640542 (1997-06-01), Whitsel et al.
patent: 5644515 (1997-07-01), Sample et al.
patent: 5661662 (1997-08-01), Butts et al.
patent: 5663900 (1997-09-01), Bhandari et al.
patent: 5717699 (1998-02-01), Haag et al.
patent: 5748875 (1998-05-01), Tzori
patent: 5751735 (1998-05-01), Tobin et al.
patent: 5754827 (1998-05-01), Barbier et al.
patent: 5757819 (1998-05-01), Segars
patent: 5771240 (1998-06-01), Tobin et al.
patent: 5777489 (1998-07-01), Barbier et al.
patent: 5790832 (1998-08-01), Barbier et al.
patent: 5801956 (1998-09-01), Kawamura et al.
patent: 5805859 (1998-09-01), Giramma et al.
patent: 5812414 (1998-09-01), Butts et al.
patent: 5812562 (1998-09-01), Baeg
patent: 5822564 (1998-10-01), Chilton et al.
patent: 5831868 (1998-11-01), Beausang et al.
patent: 5870308 (1999-02-01), Dangelo et al.
patent: 5870410 (1999-02-01), Norman et al.
patent: 5905883 (1999-05-01), Kasuya
patent: 5907697 (1999-05-01), Barbier et al.
patent: 5933356 (1999-08-01), Rostoker et al.
patent: 5937190 (1999-08-01), Gregory et al.
patent: 5943490 (1999-08-01), Sample
patent: 5951696 (1999-09-01), Naaesh et al.
patent: 5960191 (1999-09-01), Sample et al.
patent: 5963735 (1999-10-01), Sample et al.
patent: 5991523 (1999-11-01), Williams et al.
patent: 5999725 (1999-12-01), Barbier et al.
patent: 6009256 (1999-12-01), Tseng et al.
patent: 6066022 (1999-12-01), Rhim et al.
patent: 6014334 (2000-01-01), Patel et al.
patent: 6021447 (2000-02-01), Szeto et al.
patent: 6026230 (2000-02-01), Lin et al.
patent: 6041176 (2000-03-01), Shiell
patent: 6057706 (2000-05-01), Barbier et al.
patent: 6107821 (2000-08-01), Kelem et al.
patent: 6132109 (2000-10-01), Gregory et al.
patent: 6157210 (2000-12-01), Zaveri et al.
patent: 6182247 (2001-01-01), Herrmann et al.
patent: 6182268 (2001-01-01), McElvain
patent: 6188975 (2001-02-01), Gay
patent: 6191683 (2001-02-01), Nygaard, Jr.
patent: 6199031 (2001-03-01), Challier et al.
patent: 6202044 (2001-03-01), Tzori
patent: 6202172 (2001-03-01), Ponte
patent: 6212490 (2001-04-01), Li et al.
patent: 6212650 (2001-04-01), Guccione
patent: 6223148 (2001-04-01), Stewart et al.
patent: 6240376 (2001-05-01), Raynaud et al.
patent: 6247147 (2001-06-01), Beenstra et al.
patent: 6255836 (2001-07-01), Schwarz et al.
patent: 6255845 (2001-07-01), Wong et al.
patent: 6286114 (2001-09-01), Veenstra et al.
patent: 6292765 (2001-09-01), Ho et al.
patent: 6301688 (2001-10-01), Roy
patent: 6311317 (2001-10-01), Khoche et al.
patent: 6334207 (2001-12-01), Joly et al.
patent: 6336087 (2002-01-01), Burgun et al.
patent: 6363520 (2002-03-01), Boubezari et al.
patent: 6374370 (2002-04-01), Bockhaus et al.
patent: 6377911 (2002-04-01), Sample et al.
patent: 6377912 (2002-04-01), Sample et al.
patent: 6378903 (2002-04-01), Whetsel
patent: 6389558 (2002-05-01), Herrmann et al.
patent: 6389586 (2002-05-01), McElvain
patent: 6421813 (2002-07-01), Jeddeloh
patent: 6425101 (2002-07-01), Garreau
patent: 6427224 (2002-07-01), Devins et al.
patent: 6434735 (2002-08-01), Watkins
patent: 6438735 (2002-08-01), McElvain et al.
patent: 6449762 (2002-09-01), McElvain
patent: 6456961 (2002-09-01), Patil et al.
patent: 6460148 (2002-10-01), Veenstra et al.
patent: 6460174 (2002-10-01), Carey
patent: 6463392 (2002-10-01), Nygaard et al.
patent: 6470478 (2002-10-01), Bargh et al.
patent: 6477683 (2002-11-01), Killian et al.
patent: 6493852 (2002-12-01), Narain et al.
patent: 6499123 (2002-12-01), McFarland et al.
patent: 6510534 (2003-01-01), Nadeau-Dostie et al.
patent: 6513143 (2003-01-01), Bloom et al.
patent: 6564347 (2003-05-01), Mates
patent: 6567932 (2003-05-01), Edwards et al.
patent: 6571375 (2003-05-01), Narain et al.
patent: 6581191 (2003-06-01), Schubert et al.
patent: 6618584 (2003-09-01), Mann
patent: 6618839 (2003-09-01), Beardslee et al.
patent: 6633838 (2003-10-01), Arimilli et al.
patent: 6690398 (2004-02-01), Beck et al.
patent: 6697957 (2004-02-01), Wang et al.
patent: 6704889 (2004-03-01), Veenstra et al.
patent: 6571751 (2004-06-01), Murray et al.
patent: 6754760 (2004-06-01), Yee et al.
patent: 6754862 (2004-06-01), Hoyer et al.
patent: 2003/0131325 (2003-07-01), Schubert et al.
patent: 2004/0025122 (2004-02-01), Schubert et al.
patent: 4 042 262 (1992-07-01), None
Kirkovski, D., et al., “Improving the Observability and Controllability of Datapaths for Emulation-Based Debugging”, IEEE Trans. on CAD, vol. 18, Nov. 1999, pp. 1529-1541.
Haufe, M., et al., “Ein Debugger fuer ASIC-Prototypen”, pp. 10, DASS Dresden Germany, 2000.
Bulent Dervisoglu, “Design for Testability: It is time to deliver it for Time-to-Market,” Proceedings of the Internatonal Test Conference, 1999.
Keshava Iyengar Satish, “Tutorial on Design For Testability (DFT): An ASIC Design Philosophy for testability for Chips to Systems,” Sixth Annual IEEE International ASIC Conference and Exhibit, 1993.
Jan Liband, “Techniques for Real-Time Debugging,” Embedded Systems Programming, vol. 8, No. 4, Apr. 1995.
Dr. Vinod Agarwal, “Embedded IC Test: A New Plateau for DFT,” Evaluation Engineering, vol. 38, No. 9, Sep. 1999.
Stephen O'Reilly, “Debugging Drivers with Emulators and Logic Analyzers,” Embedded Systems Programming, vol. 11, No. 2, Feb. 1998.
Jack G. Ganssle, “Debuggers for Modern Embedded Systems,” Embedded Systems Programming, Nov. 1998.
Brent Miller, “Scan Conversion of ASICs,” Circuit Design, vol. 7, No. 2, Feb. 1990.
Jerry Bauer et al., “A Reconfigurable Logic Machine for Fast Event-Driven Simulation,” Design Automation Conference Proceedings (DAC), Jun. 1998, pp. 668-671.
Synopsys, Inc., “BSD Compiler” datasheet, www.synopsys.com/products/test/bsd—ds.html.
Synopsys, Inc., “DFT Compiler” Next Generation 1-Pass Test Synthesis Technology Backgrounder, Apr. 2000.
Cynthia Cousineau et al., “Design of a JTAG Based Run Time Reconfigurable System,” 7thIEEE Symposium on Field Programmable Custom Computing Machines, 1999.
John Andrews, “An Embedded JTAG, System Test Architecture,” Proceedings of ELECTRO, 1994.
Shen XuBang et al., “Design and Implementation of a JTAG Boundary-Scan Interface Controller,” Proceedings of the 2ndIEEE Asian Test Symposium, 1993.
“JTAG for

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