Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2006-06-06
2006-06-06
Phung, Anh (Department: 2824)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185270, C365S185290
Reexamination Certificate
active
07057936
ABSTRACT:
A cell array is configured by arranging a plurality of electrically writable erasable nonvolatile memory cells on a semiconductor substrate. Each of the memory cells has a charge accumulation layer formed via a first gate insulating film and a gate electrode formed on the charge accumulation layer via a second gate insulating film. A control circuit controls the sequence of writing and erasing the data into and from a memory cell selected in the memory cell. In writing the data into the memory cell, a first write operation is to apply a write pulse voltage with a first step-up voltage between the gate electrode and the semiconductor substrate. A second write operation is to apply a write pulse voltage with a second step-up voltage lower than the first step-up voltage.
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Goda Akira
Noguchi Mitsuhiro
Yaegashi Toshitake
Nguyen Hien
Oblon & Spivak, McClelland, Maier & Neustadt P.C.
Phung Anh
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