Method of manufacturing semiconductor device

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

Reexamination Certificate

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Details

C438S598000, C438S614000, C438S615000, C438S652000, C438S658000, C438S660000, C438S666000, C438S667000, C438S669000, C438S672000

Reexamination Certificate

active

07119000

ABSTRACT:
The resist film is provided on the surface of the substrate having electrodes, and openings are provided in the resist film at positions of the electrodes on the substrate. The first metal is supplied into the openings. The first metal is then heated to melt and coagulate it. The second metal is then supplied into the openings on the first metal. The first metal and the second metal are heated to melt and coagulate them. The resist film is finally removed. By this method, excellent solder bumps can be formed on the substrate without remnants of the resist film being left on the substrate.

REFERENCES:
patent: 5089881 (1992-02-01), Panicker
patent: 5356509 (1994-10-01), Terranova et al.
patent: 5461261 (1995-10-01), Nishiguchi
patent: 5861666 (1999-01-01), Bellaar
patent: 6524943 (2003-02-01), Sakuyama
patent: 6730596 (2004-05-01), Fukunaga et al.
patent: 2004/0079194 (2004-04-01), Nakata et al.
patent: 6-13382 (1994-01-01), None
patent: 2000-260819 (2000-09-01), None

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