Semiconductor device having quantum well structure, and...

Semiconductor device manufacturing: process – Making device or circuit emissive of nonelectrical signal – Compound semiconductor

Reexamination Certificate

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C257S013000, C257S090000

Reexamination Certificate

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06998284

ABSTRACT:
A method of forming a semiconductor device having a quantum well structure, comprises the steps of: (a) forming a well film at a first temperature, the well film being made of a III-V nitride semiconductor containing nitrogen, indium and gallium; (b) forming a first barrier film on the well film, the first barrier film being made of a III-V nitride semiconductor containing nitrogen, indium and gallium, and an indium composition of the first barrier film being smaller than that of the well film; (c) changing temperature without forming a semiconductor film; and (d) forming a second barrier film at a second temperature higher than the first temperature, the second barrier film being made of a III-V nitride semiconductor on the first barrier film, the first barrier film being formed at a third temperature, the third temperature being equal to or higher than the first temperature, and the third temperature being lower than the second temperature.

REFERENCES:
patent: 6738175 (2004-05-01), Morita et al.
patent: 06-268257 (1994-09-01), None
patent: 10-084132 (1998-03-01), None
patent: 2001-168471 (2001-06-01), None
patent: 2002-043618 (2002-02-01), None

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