Semiconductor memory device comprising magneto resistive...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257S421000, C257SE27006

Reexamination Certificate

active

07122854

ABSTRACT:
A semiconductor memory device includes a memory cell, a side wall insulating film, and an interlayer insulating film. A memory cell includes a first ferromagnetic film, a tunnel barrier film formed on the first ferromagnetic film, and a second ferromagnetic film formed on the tunnel barrier film. The side wall insulating film is formed so as to surround at least sides of the second ferromagnetic film. The interlayer insulating film is formed so as to cover the memory cell and the side wall insulating film.

REFERENCES:
patent: 6229170 (2001-05-01), Sakao
patent: 2002/0146851 (2002-10-01), Okazawa et al.
patent: 2004/0063223 (2004-04-01), Costrini et al.
Roy Scheuerlein, et al., “A 10ns Read and Write Non-Volatile Memory Array Using a Magnetic Tunnel Junction and FET Switch in each Cell”, 2000 IEEE International Solid-State Circuits Conference, Digest of Technical Papers, pp. 128-129.
Masashige Sato, et al., “Spin-Valve-Like Properties of Ferromagnetic Tunnel Junctions”, Jpn. J. Appl. Phys. vol. 36 (1997) pp. L200-L201.

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