Semiconductor device and manufacturing method thereof

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

Other Related Categories

C257S506000

Type

Reexamination Certificate

Status

active

Patent number

07009249

Description

ABSTRACT:
A method of manufacturing a semiconductor device is provided. The method includes providing a device isolation region for defining a device region on a mono-crystalline semiconductor layer of an SOI substrate formed with a mono-crystalline semiconductor layer through an embedded insulation payer on a semiconductor substrate of a first conductivity type. An opening is formed penetrating the device isolation region and the embedded insulation layer and reaching the semiconductor substrate. A polysilicon is deposited on the SOI substrate and within the opening and providing a gate electrode and a substrate electrode of the MIS type field-effect transistor by executing the patterning thereon; and implanting impurities into the gate electrode and the substrate electrode.

REFERENCES:
patent: 4212684 (1980-07-01), Brower
patent: 5751041 (1998-05-01), Suzuki et al.
patent: 5929488 (1999-07-01), Endou
patent: 6100567 (2000-08-01), Burr
patent: 6118152 (2000-09-01), Yamaguchi et al.
patent: 6121661 (2000-09-01), Assaderaghi et al.
patent: 6521947 (2003-02-01), Ajmera et al.

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