Method of determining library parameters using timing...

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design

Reexamination Certificate

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Reexamination Certificate

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07111261

ABSTRACT:
The present invention relates to a characterizing a timing delay curve of a circuit component, said timing delay curve having a first region and a second region. The method includes determining a first delay equation representing the first region of the delay curve, determining a second delay equation representing the second region of the delay curve, and determining a corner capacitance representing a transition point from the first region to the second region.

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Agarwal et al., “Efficient Generation of Delay Change Curves for Noise-Aware Static Timing Analysis,” IEEE, Mar. 2002, pp. 1-7.

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