Plating apparatus for plating a wafer

Chemistry: electrical and wave energy – Apparatus – Electrolytic

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

204224B, 204DIG7, 204290F, C25B 1100

Patent

active

060335408

ABSTRACT:
The present invention provides for a plating apparatus and a method of plating, which improve the uniformity of a plated coating thickness without changing the flow velocity of a feed plating solution. An aperture can be provided at a center of a meshed anode electrode of the plating apparatus to obtain an electric field density distribution between the meshed anode electrode and a wafer that is lower in the central portion of the wafer than in the edge portion of the wafer.

REFERENCES:
patent: 4530742 (1985-07-01), Carlin et al.
patent: 4589969 (1986-05-01), Yurkov et al.
patent: 4797182 (1989-01-01), Beer et al.
patent: 5391285 (1995-02-01), Lytle et al.
patent: 5429733 (1995-07-01), Ishida
patent: 5443707 (1995-08-01), Mori
patent: 5447615 (1995-07-01), Ishida

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Plating apparatus for plating a wafer does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Plating apparatus for plating a wafer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Plating apparatus for plating a wafer will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-359393

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.