Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-01-31
2006-01-31
Nguyen, Viet Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Testing
C365S189070, C365S202000, C365S196000, C365S205000
Reexamination Certificate
active
06992939
ABSTRACT:
The disclosed embodiments relate to a method and apparatus for identifying short circuits in an integrated circuit device. The method may comprise the acts of programming a first memory cell associated with a first digit line to a first data value, programming a second memory cell associated with a second digit line to a second data value, the second data value being complementary with respect to the first data value, firing a first sense amplifier associated with the first digit line, firing a second sense amplifier associated with the second digit line after a time delay with respect to the act of firing the first sense amplifier associated with the first digit line, detecting a measured data value associated with the second digit line, and comparing the measured data value to the second data value to determine whether the first digit line is short circuited to the second digit line. The apparatus may comprise a first sense amplifier that is associated with a first digit line, a second sense amplifier that is associated with a second digit line, and a circuit that delays a firing operation of the second sense amplifier with respect to a firing operation of the first sense amplifier to allow detection of a short circuit between the first digit line and the second digit line.
REFERENCES:
patent: 4692900 (1987-09-01), Ooami et al.
patent: 5274276 (1993-12-01), Casper et al.
patent: 5297087 (1994-03-01), Porter
patent: 5304506 (1994-04-01), Porter et al.
patent: 5331594 (1994-07-01), Hotta
patent: 5369317 (1994-11-01), Casper et al.
patent: 5440516 (1995-08-01), Slemmer
patent: 5793686 (1998-08-01), Furutani et al.
patent: 5892720 (1999-04-01), Stave et al.
patent: 5901078 (1999-05-01), Porter et al.
patent: 5903502 (1999-05-01), Porter
patent: 6002623 (1999-12-01), Stave et al.
patent: 6114878 (2000-09-01), Loughmiller et al.
patent: 6141272 (2000-10-01), Van de Graaff et al.
patent: 6219293 (2001-04-01), Butler et al.
patent: 6249468 (2001-06-01), Kan et al.
patent: 6266287 (2001-07-01), Porter
patent: 6269037 (2001-07-01), Porter
patent: 6275409 (2001-08-01), Porter et al.
patent: 6297998 (2001-10-01), Van de Graaff et al.
patent: 6351425 (2002-02-01), Porter
patent: 6355508 (2002-03-01), Porter et al.
patent: 6365937 (2002-04-01), Porter et al.
patent: 6385098 (2002-05-01), Butler et al.
patent: 6396300 (2002-05-01), Loughmiller et al.
patent: 6438049 (2002-08-01), Porter
patent: 6445610 (2002-09-01), Porter et al.
patent: 6496421 (2002-12-01), Van De Graaf et al.
patent: 6515923 (2003-02-01), Cleeves
patent: 6515925 (2003-02-01), Graham et al.
patent: 6576960 (2003-06-01), Porter et al.
patent: 6593218 (2003-07-01), Porter et al.
patent: 6628144 (2003-09-01), Loughmiller et al.
patent: 6704238 (2004-03-01), Izutsu et al.
patent: 6781897 (2004-08-01), Dvir et al.
patent: 02001195900 (2001-07-01), None
Nguyen Viet Q.
Yoder Fletcher
LandOfFree
Method and apparatus for identifying short circuits in an... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for identifying short circuits in an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for identifying short circuits in an... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3591066