Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-26
2006-09-26
Lin, Sun James (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07114138
ABSTRACT:
The present invention introduces novel methods of performing integrated circuit layout extraction. In the system of the present invention, complex resistance extraction problem is first broken down into a set of smaller extraction sub problems. Some of the smaller extraction sub problems may be handled by simple parametric models. For example, extracting the resistance from a straight section of interconnect wire may be performed by multiplying a known resistance per unit length by the length of the straight section of interconnect wire. For more complex resistance extraction sub problems, machine learning is used to build models.
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Chatterjee Arindam
Teig Steven
Cadence Design Systems Inc.
Lin Sun James
Stattler, Johansen, and Adeli
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