Static information storage and retrieval – Read/write circuit – Signals
Reexamination Certificate
2006-01-31
2006-01-31
Ho, Hoai (Department: 2827)
Static information storage and retrieval
Read/write circuit
Signals
C365S185280, C365S185290
Reexamination Certificate
active
06992936
ABSTRACT:
Externally supplied program data is latched into data latch circuits DLL and DLR. A judgment is made as to whether or not the latched program data corresponds to any threshold value of multi-levels every time each of plural programing operations is carried out. The program control information corresponding to the judgment result is latched into a sense latch circuit SL. Based upon the latched program control information, the programing operation for setting threshold voltages having multi-levels to a memory cell is carried out in a stepwise manner. Even when the programing operation is ended, the externally supplied program data is left in the data latch circuit. Even when the programing operation of the memory cell is retried due to the overprograming condition, the program data is no longer required to be again received from the external device.
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“Flash Memory—Multi-Level Memory, US Makers Set About Technological Development Precedent and Bring to the Commercial Stage in 1995, Getting Over Reliability,” (with English translation).
Kanamitsu Michitaro
Kubono Shoji
Matsubara Ken
Nozoe Atsushi
Tsujikawa Tetsuya
Antonelli, Terry Stout and Kraus, LLP.
Hitachi Ulsi Systems Co., Ltd.
Ho Hoai
Renesas Technology Corp.
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