Device for margin testing a semiconductor memory by applying...

Details Device for margin testing a semiconductor memory by applying... Device for margin testing a semiconductor memory by applying...

2006-01-10

2006-01-10

Mai, Son (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

C365S202000, C365S203000

Reexamination Certificate

active

06985393

ABSTRACT:
A margin test on a Dynamic Random Access Memory (DRAM) in accordance with the invention begins with a supply voltage level being stored in all memory cells of the DRAM. Circuitry incorporated into each sense amplifier of the DRAM then isolates the digit line equilibrating circuitry in each sense amplifier from the cell plate voltage DVC2or supply voltage VCCto which the equilibrating circuitry is normally connected and connects the equilibrating circuitry to ground instead.

REFERENCES:
patent: 5208778 (1993-05-01), Kumanoya
patent: 5265056 (1993-11-01), Butler
patent: 5297087 (1994-03-01), Porter
patent: 5500824 (1996-03-01), Fink
patent: 5523977 (1996-06-01), Tobita et al.
patent: 5544108 (1996-08-01), Thomann
patent: 5610867 (1997-03-01), DeBrosse
patent: 5710740 (1998-01-01), Manning
patent: 5754486 (1998-05-01), Nevill et al.
patent: 5822258 (1998-10-01), Casper
patent: 5877993 (1999-03-01), Biegel et al.
patent: 5903502 (1999-05-01), Porter
patent: 5959913 (1999-09-01), Raad
patent: 5982682 (1999-11-01), Nevill et al.
patent: 6002622 (1999-12-01), Dean
patent: 6055199 (2000-04-01), Hamade et al.
patent: 6061285 (2000-05-01), Tsukikawa
patent: 6088819 (2000-07-01), Adachi et al.
patent: 6101139 (2000-08-01), Dean
patent: 6154401 (2000-11-01), Casper et al.
patent: 6256242 (2001-07-01), Dean
patent: 6266287 (2001-07-01), Porter
patent: 6327201 (2001-12-01), Dean
patent: 6442086 (2002-08-01), Dean
patent: 6801469 (2004-10-01), Cowles
Prince, B., “Semiconductor Memories: A Handbook of Design, Manufacture and Application,” (Wiley 1991, reprinted 1996).

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