Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-04-04
2006-04-04
Garbowski, Leigh M. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000
Reexamination Certificate
active
07024655
ABSTRACT:
A mask is prepared by processing design data with various combinations of rule-based and model-based optical proximity correction. In one embodiment, the design data is first processed with a set of optical proximity correction rules to produce a rule-corrected design. The rule-corrected design is examined to identify a set of features to process with model-based optical proximity correction. Then, the set of features are processed with the model-based optical proximity correction.
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Asai, N
Christensen O'Connor Johnson & Kindness PLLC
Garbowski Leigh M.
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