Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-07-11
2006-07-11
Whitmore, Stacy A. (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
Reexamination Certificate
active
07076746
ABSTRACT:
The present invention is directed to a method and apparatus for mapping platform-based design to multiple foundry processes. According to an exemplary aspect of the present invention, a method for mapping platform-based design to multiple foundry processes may include the following steps. First, a virtual process is defined to include at least one fabrication process. A virtual process is a totality of variables associated with the population of candidate processes and any other process of interest, which might be purely hypothetical, that would be capable, in principle, of accommodating some or all slices. A virtual process may or may not be realized and is an abstract logical container for a population of processes. Then, the virtual process may be stored into a database. The virtual process may be in a representation including a list of attributes of entities making up the fabrication process. Next, optimization of the database may be performed using mathematical and statistical tools.
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Hamlin Christopher L.
Koford James S.
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