SONOS structure including a deuterated oxide-silicon...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C257S411000

Reexamination Certificate

active

07042054

ABSTRACT:
A method for processing a semiconductor topography is provided, which includes diffusing deuterium across one or more interfaces of a silicon-oxide-nitride-oxide-silicon (SONOS) structure. In particular, the method may include diffusing deuterium across one or more interfaces of a SONOS structure during a reflow of a dielectric layer spaced above the SONOS structure. In some embodiments, the method may include forming a deutereated nitride layer above the SONOS structure prior to the reflow process. In addition or alternatively, the method may include forming a deutereated nitride layer within the SONOS structure prior to the reflow process. In some cases, the method may further include annealing the SONOS structure with a deutereated substance prior to forming the deutereated nitride layer. In either embodiment, a SONOS structure may be formed which includes deuterium arranged within an interface of a silicon layer and an oxide layer of the structure.

REFERENCES:
patent: 5972765 (1999-10-01), Clark et al.
patent: 6023093 (2000-02-01), Gregor et al.
patent: 6114734 (2000-09-01), Eklund
patent: 6140187 (2000-10-01), DeBusk et al.
patent: 6147014 (2000-11-01), Lyding et al.
patent: 6661065 (2003-12-01), Kunikiyo

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

SONOS structure including a deuterated oxide-silicon... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with SONOS structure including a deuterated oxide-silicon..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and SONOS structure including a deuterated oxide-silicon... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3568830

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.